Minolta CM-2002 Spectrophotometer

• Reflectivity measurements, SCI (Specular Component Included)

• Scattered light measurements, SCE (Specular Conponent Excluded)

• Diffuse illumination, 8° viewing geometry

• Conforms to ISO, DIN, & ASTM standards

• 400 - 700 nanometer range, 10 nm steps

• Hand held directly on the mirror surface

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